Janse Van Vuuren, A. .., CHRTEM NMU, South Africa
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Vol 3, No 4 (2019) - Статьи
MD and TEM evaluation of swift Xe ion induced latent tracks in Si3N4
Abstract PDF (Eng)
ISSN 2522-9869 (Print)
ISSN 2616-8537 (Online)
ISSN 2616-8537 (Online)
